题目：Addressing Hardware Reliability Challenges in the Presence of Process Variation
报告人：李涛博士 佛罗里达大学
地点：东五楼二楼210学术报告厅
时间：6月4日上午9：00

报告摘要：
　　With the continuous down-scaling of CMOS processing technology, computer architects have built high-performance and low-power many/multi-coprocessors. On the other hand, as the processing technology pushes towards nano-scale, silicon reliability becomes one of the most important challenges in the design and fabrication of future microprocessors. The failure mechanisms could significantly degrade chip reliability and lifetime, and result in large economic losses. It is imperative to build a reliable processor while achieving an optimal trade-off among performance, reliability and power. In this talk, I will introduce several emerging failure mechanisms (e.g. soft error, negative bias temperature instability (NBTI), and process variation) and present three processor vulnerability-mitigation methodologies. The first methodology characterizes and mitigates the processor microarchitecture soft-error vulnerability in the presence of process variation. I will describe two techniques working at fine and coarse grain levels to efficiently improve the processor soft-error robustness. The second methodology observes the positive interplay between two failure mechanisms (NBTI and process variation) and intelligently leverages this interaction to tolerate their detrimental impact on reliability. The third methodology presented in this talk targets on hierarchically mitigating the NBTI and process variation effects on network-on-chip, a crucial hardware component in future many/multi-core processors.

报告人简介：
　　Dr. Tao Li is currently an assistant professor in the Department of Electrical and Computer Engineering at the University of Florida. He received a Ph.D. in Computer Engineering from the University of Texas at Austin. His research interests include computer architecture, energy-efficient and dependable microprocessors, memory systems and networks-on-chip, the impacts of emerging technologies and applications on hardware and operating/run-time systems, and evaluation of computer systems. Dr. Tao Li received 2009 National Science Foundation Faculty Early CAREER Award, 2008, 2007, 2006 IBM Faculty Awards, 2008 Microsoft Research Safe and Scalable Multi-core Computing Award and 2006 Microsoft Research Trustworthy Computing Curriculum Award.